Electron Microscope Unit (EMU)

The JEM-GrandARM300F2 (GrandARM) is a 300 kV double aberration-corrected TEM with up to 0.05 nm resolution in both STEM and TEM modes. It is equipped with EDX, EELS, and segmented STEM detectors. The GrandARM can be used to image a wide range of materials at the atomic level, including magnetic materials and electric fields, and can utilise our range of in-situ holders.

The Thermo Fisher Scientific Talos Arctica is a 200kV Cryo-Transmission Electron Microscope (Cryo-TEM) managed with the Victor Chang Cardiac Research Institute. This versatile system excels in high-resolution 3D imaging of biological and biomaterial samples. It features advanced automation, including robotic sample handling and automated loading for up to 12 samples, enhancing data acquisition speed and efficiency. The Talos Arctica supports a wide range of applications, from single-particle analysis to tomography, making it invaluable for researchers in cell biology, structural biology, and nanotechnology. Its sophisticated software suite provides detailed insights into the structure and function of complex biological systems.

The Zeiss 550 Crossbeam FIB-SEM combines high-resolution SEM imaging with advanced FIB capabilities for TEM lamella preparation, nanofabrication, and 3D analysis in materials and life sciences.

• Materials Science: It features a Gemini 2 SEM, Ion-sculptor Ga-FIB, and gas injection systems for in-situ deposition. SmartFIB and drift correction enable precise milling and data collection. It includes an Oxford Ultim Max 170 SDD EDS for elemental analysis and Atlas 5 software for nanofabrication and 3D EDS imaging.
• Life Science: Equipped with a Quorum cryo-stage and cryo-transfer system, it supports cryo-SEM, TEM lamella preparation, and 3D imaging. The correlative cryo workflow integrates cryo light microscopy, cryo-FIB, and cryo-TEM.

The Thermo Scientific Helios G4 PFIB UXe is an advanced platform for large volume 3D characterization, Ga-free sample preparation, and precise micromachining. It features a 2.5 µA Xe plasma focused ion beam and high-resolution electron column, offering 50x faster milling than Ga-based FIBs. It supports rapid cross-sectioning, in-situ deposition, and selective etching. Equipped with an Easylift micromanipulator and a 6” piezo stage, it ensures reliable 3D data acquisition. The system includes EBSD and EDS capabilities for high-speed elemental analysis and phase identification, making it ideal for advanced materials characterization in both 2D and 3D.

The NanoSEM 450 is a field-emission scanning electron microscope (FE-SEM) offering ultra-high imaging resolution without size restrictions. Its Schottky field-emission source provides high-resolution imaging at various kV levels. It supports secondary electron (SE) imaging in both field-free and immersion modes for diverse sample analysis. The NanoSEM 450 includes a retractable annular backscattered electron detector and an Oxford silicon drift detector (SDD-EDS) for visualizing compositional differences on specimen surfaces, making it versatile for both high-resolution and microanalytical imaging.

The JEOL JXA-8500F is a microanalytical instrument providing sub-micron level elemental analysis. It features five WDS and a JEOL SDD-EDS, detecting most elements with <0.05% detection limits. Its Schottky field-emission gun supports low-kV work with a stable, high-current beam. It analyzes bulk materials, phases, inclusions, and grain boundaries in various samples like geological specimens, fuel cells, and metals. Sample holders accommodate 26mm resin-mounted specimens and thin sections. Samples must be dry, flat, conductive, and vacuum-stable, typically embedded in resin, polished, and carbon-coated for conductivity.