This free talk on 15th October 2019 - 1.30pm-2.30pm is by MWAC invited Prof. Ian W. Fletcher, CSci CChem FRSC, Visiting Professor, Faculty of Engineering and Physical Sciences, University of Surrey, England. Prof Fletcher will present a summary of the Time-of-Flight Secondary Ion Mass Spectrometry (‘ToFSIMS’) analytical technique along with examples where surface chemical analysis has helped with a variety of product and material developments and problem solving. Examples will be presented of coating failures, organic and biomaterial analyses, contamination issues, polymer developments, analysis of dinosaur skin, catalyst poisoning, surface cleaning, depth profiling and cryo-analysis.
