EMU has two Hitachi S3400 SEMs – both are able to do imaging and X-ray microanalysis. These instruments are fitted with secondary and backscatter electron detectors that allow for topographic and compositional (atomic number contrast) surface imaging of samples. These microscopes are routinely used for imaging from ~20x to ~20,000x magnification. The S3400 SEMs are predominantly used in high-vacuum mode, but also have a variable-pressure or “natural” mode that can be useful when imaging vacuum-sensitive specimens or specimens with conductivity problems.
For further information about the use of the S3400 SEM please contact Karen Privat.
