The Hitachi TM4000Plus benchtop SEM is a user-friendly but powerful imaging and microanalysis tool. This SEM operates at accelerating voltages of 5-20 kV, and is integrated with a Bruker SDD-EDS detector for rapid spatially-resolved elemental microanalysis. Optical and SEM image registration are performed automatically, and large-area image stitching is also available. Users can select between high, medium and low vacuum imaging modes, with backscattered electron (BSE) imaging and gaseous SE imaging options (SE in low-vacuum mode only). Hitachi Map 3D software allows 3D images of sample surfaces to be generated without sample/stage tilting or image shift by simultaneously capturing multiple directional images with the segmented BSE detector.
For further information about the TM4000Plus SEM please contact Dr. Karen Privat.
