Dr Richard Webster

Research Associate

Category: Academic Staff

Biography

Education

PhD Physics, University of Bristol, UK (2015)

MSci PhysicsUniversity of Bristol, UK (2011)

Role

To train, aid and manage users on the JEOL F200 microscope

Research Interests

My interests lie in the application of electron microscopy methods to determine composition, structure and defect nature of semiconductors, mainly III-nitrides. My present research includes the application of electron microscopy to InxGa1-xN nanorods and films for use in LED and transistor devices. Recent research has included:

-          the compositional profiling, using energy dispersive X-ray spectroscopy, of InxGa1-xN nanorods to understand the growth mechanisms of these structures,

-          the application of electron diffraction techniques to determine the structure of materials, mainly semiconductors and

-          the use of novel substrates, such as polycrystalline diamond, for improved thermal characteristics of semiconductor devices.

Publications

GaN/InGaN:

Microstructure of In x Ga1− x N nanorods grown by molecular beam epitaxy

RF Webster, QY Soundararajah, IJ Griffiths, D Cherns… - Semiconductor Science and Technology, 2015

Electron microscopy of gallium nitride growth on polycrystalline diamond

RF Webster, D Cherns, M Kuball, Q Jiang, D Allsopp - Semiconductor Science and Technology, 2015

Compositional variations in In0. 5Ga0. 5N nanorods grown by molecular beam epitaxy

D Cherns, RF Webster, SV Novikov, CT Foxon… - Nanotechnology, 2014

Other:

Tungsten oxide nanorod growth by pulsed laser deposition: influence of substrate and process conditions

P Huang, MMA Kalyar, RF Webster, D Cherns… - Nanoscale, 2014

My Research Activities

Education

PhD Physics, University of Bristol, UK (2015)

MSci PhysicsUniversity of Bristol, UK (2011)

Role

To operate the newly purchased JEOL F200 microscope, design and implement research experiments in collaboration with researchers across the University in the area of advanced transmission electron microscopy, including high-resolution imaging, electron diffraction, energy-dispersive X-ray spectroscopy analysis, and other imaging and analysis modes where applicable.

Research Interests

My interests lie in the application of electron microscopy methods to determine composition, structure and defect nature of semiconductors, mainly III-nitrides. My present research includes the application of electron microscopy to InxGa1-xN nanorods and films for use in LED and transistor devices.

Publications

Contact

+61-2-9385-6709